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當(dāng)前位置：首頁(yè) > 產(chǎn)品中心 > 二維材料 > 硫化物晶體 > 二硫化鉭晶體（2H/百分之99.995） TaS2
簡(jiǎn)要描述：二硫化鉭晶體（2H） TaS2（Tantalum Sulfide） -2H晶體尺寸：~10毫米電學(xué)性能：Metal, Charge density waves （CDW） system below ~75K, Superconductor with Tc ~1K 金屬、電荷密度波（CDW）晶體結(jié)構(gòu)：六邊形晶胞參數(shù)：a = b = 0.331 nm,
產(chǎn)品型號(hào)： 廠商性質(zhì)：生產(chǎn)廠家更新時(shí)間：2026-04-09訪 問(wèn) 量：1678詳細(xì)介紹
二硫化鉭晶體(2H) TaS2(Tantalum Sulfide) -2H
晶體尺寸：~10毫米
電學(xué)性能：Metal, Charge density waves (CDW) system below ~75K, Superconductor with Tc ~1K
金屬、電荷密度波(CDW)
晶體結(jié)構(gòu)：六邊形
晶胞參數(shù)：a = b = 0.331 nm, c = 1.207 nm, α = β = 90, γ = 120°
晶體類型：合成
晶體純度：＞99.995%
X-ray diffraction on a 2H phase Tantalum Disulfide single crystal aligned along the (001) plane. XRD was performed at room temperature using a D8 Venture Bruker. The 4 XRD peaks correspond, from left to right, to (00l) with l = 2, 4, 6, 8
Powder X-ray diffraction (XRD) of a single crystal 2H-TaS2. X-ray diffraction was performed at room temperature using a D8 Venture Bruker.
Stoichiometric analysis of a single crystal 2H-TaS2 by Energy-dispersive X-ray spectroscopy (EDX).
Raman spectrum of a single crystal 2H-TaS2. Measurement was performed with a 785 nm Raman system at room temperature.
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